- Lt. General H.H Sheikh Saif bin Zayed Al Nahya

Lt. General H.H Sheikh Saif bin Zayed Al Nahyan, Deputy Prime Minister and Minister of Interior, reiterated the keenness of the U.A.E. leadership, under the wise leadership of His Highness Sheikh Khalifa bin Zayed Al Nahyan, President of the U.A.E., to keep abreast of the latest global developments and innovations, so as to enhance the country’s prestigious present stature and ensure its leadership into the future.
HH hailed the unrelenting development efforts exerted by His Highness Sheikh Mohammed bin Rashid Al Maktoum, Vice President and Prime Minister and Ruler of Dubai, via the numerous initiatives, which aim at ensuring a bright future for the coming generations. Moreover, Sheikh Saif praised the ‘Happiness Meter’ initiative, which seeks to measure the happiness and satisfaction of the public in government services. This initiative has reflected positively on government departments, in their quest to be at the forefront and to promote the electronic and smart services system.
HH made these remarks on Thursday, while touring the 34th GITEX Technology Week held at the Dubai World Trade Centre. Sheikh Saif overviewed the exhibition’s various booths and pavilions, and got acquainted with the latest innovations provided by the various participating entities in the field of technology and e-services produced worldwide. Moreover, HH expressed his admiration for the level of modernity and organization, which reflects the capabilities of the UAE, as well as the skills and accumulated experience of the Emiratis in organizing prestigious exhibitions.
During the tour, he was briefed by a number of exhibitors on the latest programs, services and projects showcased at the exhibition. Moreover, HH exchanged talks with exhibitors to get insight into their impressions with respect to the exhibition, which succeeded in consolidating its position on the global map of specialized exhibitions.